Roughness measuring device contour measuring device

Hommel T 8000 RC

Hommel T 8000 RC roughness measuring device

Combined roughness and contour measuring system

Measurement accuracy: 0.2µm - 12µm

- Hommel Tester T 8000 RC

- Wavelift 800 ADVANED measuring column

- Waveline 200 TOP

-Basic unit tilting unit 200 Zuwaveline

- Various probes

- Stone plate Wavesystem 1000 x 500 x 140mm

- Measuring table cross table XY0

You are welcome to come by for a viewing.

We are happy to organize a cost-effective shipping company

for you!

You will receive a proper invoice.

A net invoice can also be issued for foreign customers. A valid VAT identification number is required.
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Subject to prior sale.

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Deviations from technical data and errors in the description of the article can occur and are reserved.

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